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Filtros : "Journal of Electronic Testing" Limpar

Filtros

Artigo de periodico
Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs (2021)
González, Carlos J; Medina, Nilberto Heder
Source: Journal of Electronic Testing. Unidade: IF
Assunto: RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GONZÁLEZ, Carlos J e MEDINA, Nilberto Heder. Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. Journal of Electronic Testing, 2021Tradução . . Disponível em: https://doi.org/10.1007/s10836-021-05952-2. Acesso em: 28 abr. 2024.
APA
González, C. J., & Medina, N. H. (2021). Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. Journal of Electronic Testing. doi:10.1007/s10836-021-05952-2
NLM
González CJ, Medina NH. Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs [Internet]. Journal of Electronic Testing. 2021 ;[citado 2024 abr. 28 ] Available from: https://doi.org/10.1007/s10836-021-05952-2
Vancouver
González CJ, Medina NH. Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs [Internet]. Journal of Electronic Testing. 2021 ;[citado 2024 abr. 28 ] Available from: https://doi.org/10.1007/s10836-021-05952-2
Artigo de periodico
A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling (2011)
Castro Márquez, Carlos Iván; Tobar, Edgar Leonardo Romero; Strum, Marius; Wang, Jiang Chau
Source: Journal of Electronic Testing. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
CASTRO MÁRQUEZ, Carlos Iván et al. A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling. Journal of Electronic Testing, v. 27, n. 4, p. 485-503, 2011Tradução . . Disponível em: https://doi.org/10.1007/s10836-011-5225-8. Acesso em: 28 abr. 2024.
APA
Castro Márquez, C. I., Tobar, E. L. R., Strum, M., & Wang, J. C. (2011). A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling. Journal of Electronic Testing, 27( 4), 485-503. doi:10.1007/s10836-011-5225-8
NLM
Castro Márquez CI, Tobar ELR, Strum M, Wang JC. A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling [Internet]. Journal of Electronic Testing. 2011 ; 27( 4): 485-503.[citado 2024 abr. 28 ] Available from: https://doi.org/10.1007/s10836-011-5225-8
Vancouver
Castro Márquez CI, Tobar ELR, Strum M, Wang JC. A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling [Internet]. Journal of Electronic Testing. 2011 ; 27( 4): 485-503.[citado 2024 abr. 28 ] Available from: https://doi.org/10.1007/s10836-011-5225-8

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